{"id":866,"date":"2025-10-29T22:22:42","date_gmt":"2025-10-29T13:22:42","guid":{"rendered":"https:\/\/emiu.sfc.keio.ac.jp\/wp\/?p=866"},"modified":"2025-11-04T17:02:40","modified_gmt":"2025-11-04T08:02:40","slug":"occe2025-ifip-tc3%e3%81%a7%e7%99%ba%e8%a1%a8%e3%82%92%e3%81%97%e3%81%be%e3%81%97%e3%81%9f","status":"publish","type":"post","link":"https:\/\/emiu.sfc.keio.ac.jp\/wp\/?p=866","title":{"rendered":"OCCE2025 (IFIP TC3)\u3067\u767a\u8868\u3092\u3057\u307e\u3057\u305f"},"content":{"rendered":"\n<p>2025\u5e7410\u670828\u65e5\uff5e31\u65e5\u306b\u30e2\u30ed\u30c3\u30b3\u306e Universit\u00e9 Internationale de Rabat\uff08\u30e9\u30d0\u30c8\u56fd\u969b\u5927\u5b66\uff09\u3067\u958b\u50ac\u3055\u308c\u305f IFIP OCCE2025\uff08Open Conference on Computers in Education 2025 by The International Federation for Information Processing, Technical Committee 3\uff09\u306b\u304a\u3044\u3066\u3001\u8c37\u304c &#8220;Mock Examinations in Informatics as a Foundation for Assessment Design in Japanese University Admissions&#8221;, Seiichi Tani (Nihon U.), K. Uehara (Keio U.), H. Kakuda (UEC), K. Kakehi (Tokyo Online U.), N. Takahashi (Kokugakuin U.), T. Tatsumi (Open U. of Japan), Y. Nakano (Kogakuin U.), Y. Nakayama (UEC), T. Nishida (Kogakuin U.), K. Hagihara (U. of Osaka), H. Bandoh (Dokkyo Medical U.) and Y. 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